HEFBT from NEXPERIA >> Specification: Decade Counter, 30 MHz, 1 Gate, 1 Input, 3 V to 15 V, SOIC Technical Datasheet: HEFBT Datasheet. HEFBT, Nexperia Counter ICs 5-STAGE JOHNSON COUNTER datasheet, inventory, & pricing. HEFBT datasheet, HEFBT circuit, HEFBT data sheet: PHILIPS – 5 -stage Johnson counter,alldatasheet, datasheet, Datasheet search site for.
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HEFBT Datasheet(PDF) – NXP Semiconductors
Functional description Table 3. Preliminary [short] data sheet Hef4017bh This document contains data from the preliminary specification. Test circuit Table Dynamic power dissipation PD PD can be calculated from the formulas shown.
Measurement points given hfe4017bt Table 9. Automatic counter code correction is provided by an internal circuit: Plastic or metal protrusions of 0. NXP Semiconductors does not give any representations or warranties as to the accuracy or completeness of information included herein and shall have no liability for the consequences of use of such information. Package SOT74 removed from Section 4.
IEE logic symbol 6. This document supersedes and replaces all information supplied prior to the publication hereof. Terms and conditions of sale — NXP Semiconductors products are sold subject to the general terms and conditions of commercial sale, as published at http: The latest product status information is available on the Internet at URL http: Definitions for test circuit: Exposure to limiting values for extended periods may affect device reliability. Product [short] data sheet Production This document contains the product specification.
Decoded outputs are sequential within each stage and from stage to stage, with no dead time except propagation hef4017ht. All referenced brands, product names, service names and trademarks are the property of their respective owners.
For more information, please visit: Recommended operating conditions Table 5. For detailed and full information see the relevant full data sheet, which is available on request via the local NXP Semiconductors sales office. Limiting values are stress ratings only and operation of the device at these or any other conditions above those given in the Characteristics sections of this document is not implied.
A short data sheet is intended for quick reference only and should not be relied upon to contain detailed and full information.
(PDF) HEF4017BT Datasheet download
Suitability for use — NXP Semiconductors products are not designed, authorized or warranted to be suitable for use in medical, military, aircraft, space or life support equipment, nor in applications where failure hef4017tb malfunction of an NXP Semiconductors product can reasonably be expected to result in personal injury, death or severe property or environmental damage.
When cascading counters, the Q output, which is LOW while the counter is in states 5, 6, 7, 8, and 9, can hef4017vt used to drive the CP0 input of the next counter.
Short data sheet — A short data sheet is an extract from a full data sheet with the same product type number s and title. Schmitt trigger action makes the clock inputs highly tolerant of slower rise and fall times. NXP Semiconductors makes datashee representation or warranty that such applications will be suitable for the specified use without further testing or modification.
Limiting values Table 4.
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Ordering information Table 1. Contact information For more information, please visit: However, NXP Semiconductors does not give any representations or warranties, expressed or implied, as to the accuracy or completeness of such information and shall have no liability for the consequences of use of such information.
Dynamic characteristics Table 7. Revision history Table Rename the pins throughout to be consistent with rest of HEF family.
HEFBT – 5-stage Johnson decade counter | Nexperia
Right to make changes — NXP Semiconductors reserves the right to make changes to information published in this document, including without limitation specifications and product descriptions, at any time and without notice. In case of any inconsistency or conflict between information in this document and such terms and conditions, the latter will prevail. Limiting values — Stress above one or more limiting values as defined in the Absolute Maximum Ratings System of IEC may cause permanent damage to the device.
Applications — Applications that are described herein for any of these products datasheer for illustrative purposes only. In case of any inconsistency or conflict with the short data sheet, the full data datashest shall prevail. The content is still under internal review and subject to formal approval, which may result in modifications or additions. Static characteristics Table 6. No offer to sell or license — Nothing in this document may be interpreted or construed as an offer to sell products that is open for acceptance or the grant, conveyance or implication of any license under any copyrights, patents or other industrial or intellectual property rights.